DDECS 2013 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

DDECS provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The Symposium is organized by Brno University of Technology, Faculty of Information Technology, and sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

Invited Speakers
Rolf Drechsler (University of Bremen/DFKI, Germany)
Erik Jan Marinissen (IMEC, Belgium)
Kaushik Roy (Purdue University, USA)

Topics of interest include but are not limited to:

SoC and NoC Design and Test
ASIC/FPGA Design
Built-in Self-Test and Self-Repair
Bio-Inspired Hardware
Design Verification/Validation
Formal Methods in System Design
Hardware/Software Co-Design
IP-based Design
Logic Synthesis
Defect/Fault Tolerance and Reliability
Design and Test in Nano-Technologies
Analog, Mixed-Signal, RF Design and Test
ATE Hardware and Software
Design for Testability and Diagnosis
On-line Testing
Embedded Systems Testing
Memory, Processor Testing
MEMS Testing
Physical Design
Dependable HW/SW Systems

Submissions

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Prospective authors are cordially invited to submit original papers using the electronic submission system at the Symposium web page. Papers in English with a length of 6 pages maximum in IEEE conference style are expected. Accepted papers will be included to the Symposium Proceedings and will be available through the IEEE Xplore Digital Library. Specialized student and industrial sessions, as well as embedded tutorials, will be organized at the symposium. Proposals for tutorials can also be submitted through the electronic submission system.

Key Dates

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Submission deadline: January 8, 2013
Notification of acceptance: February 25, 2013
Final copy deadline: March 10, 2013

Additional Information

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Lukas Sekanina, sekanina@fit.vutbr.cz
Goerschwin Fey, Goerschwin.Fey@dlr.de

Committees

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General Chair:
Lukas Sekanina, Brno University of Technology, Czech Republic

Program Chair:
Goerschwin Fey, German Aerospace Center, Germany

General Vice-chair:
Jaan Raik, Tallinn University of Technology, Estonia

Program Co-Chair:
Snorre Aunet, Norwegian University of Science and Technology, Norway

Topic Chairs:
Ondrej Novak, Technical University of Liberec, Czech Republic
Martin Danek, Academy of Sciences of the Czech Republic, Czech Republic
Said Hamdioui, TU Delft, Netherlands

Organizing Committee Chair:
Richard Ruzicka, Brno University of Technology, Czech Republic

For more information, visit us on the web at: http://www.fit.vutbr.cz/events/ddecs2013

The 16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2012) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).